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1.1 apply testing procedures to a range of semiconductor devices and circuits

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1.1 apply testing procedures to a range of semiconductor devices and circuits

Unit 39: Electronic Principles Unit code: J/601/1448

Learning outcomes

On successful completion of

this unit a learner will:

Assessment criteria for pass

The learner can:

 

LO1 Be able to apply testing

procedures for

semiconductor devices and

circuits

 

1.1 apply testing procedures to a range of semiconductor

devices and circuits

1.2 use relevant literature for testing semiconductor devices

and circuits

 

LO2 Understand the

characteristics and operation

of amplifier circuits

 

2.1 analyse the operation of different types of amplifier

2.2 evaluate the actual performance of different types of

amplifier

2.3 compare the analysis with the measured results

2.4 modify circuit designs to meet revised specifications

 

LO3 Understand the types and

effects of feedback on circuit

performance

 

3.1 describe types of feedback and determine the effects on

circuit performance when feedback is applied

3.2 design a circuit employing negative feedback

3.3 investigate the effects of applying feedback to single and

multi-stage circuits

 

LO4 Understand the operation

and applications of sine

wave oscillators

 

4.1 describe the circuit conditions and the methods used to

achieve sinusoidal oscillation

4.2 build and evaluate a sine wave oscillator to a given

specification

4.3 explain the advantages of crystal-controlled oscillator

circuits.


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  • Title: 1.1 apply testing procedures to a range of semiconductor devices and circuits
  • Price: £ 119
  • Post Date: 2018-11-10T12:47:44+00:00
  • Category: Assignment
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1.1 apply testing procedures to a range of semiconductor  devices and circuits 1.1 apply testing procedures to a range of semiconductor devices and circuits
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